”@”@”@”@IDDq design and testing solution


”@”@Test time (cost) reduction ”@”@”@”@”@”@”@”@”@”@

”@”@Test data quality improvement

”@”@Product quality and reliability improvement


”@Q-Star Test”¦ static/quiescent current measurement instruments
”@(also referred to as Iddq or Issq modules) serve a wide range
”@of applications:

”@”@”@”@Standard and advanced Iddq tests

”@”@”@”@Stand-by current measurements

”@”@”@”@Power-down current measurements

”@”@”@”@Bias current measurements

”@”@”@”@Average current measurements

”@”@”@”@Analog DC and low frequency current measurements


”@Equally, Q-Star Test”¦s dynamic current measurement instruments
”@(also referred to Iddt modules) serve a wide range of applications:

”@”@”@”@Dynamic and transient (Iddt) current tests

”@”@”@”@Power profiling of circuits and systems

”@”@”@”@Active current consumption

”@”@”@”@E-fuse programming validation


”@”@”@”@Improving your Device Quality by

”@”@”@”@”@”@Extended IDDQ measurements
”@”@”@”@”@”@Advanced IDDQ test strategies
”@”@”@”@”@”@Fast Low Current measurements

”@”@”@”@Static or Dynamic Power Profiling on

”@”@”@”@”@”@Semiconductor devices
”@”@”@”@”@”@Low power devices

”@”@”@”@”@”@Electronic circuits and systems

”@”@”@”@Dynamic Current Analysis

”@”@”@”@Fast measurements of Leakage Currents.

”@”@”@”@Highly accurate ”§normal”Ø Current Measurements
”@”@”@”@”@”@by tiny high resolution modules

”@”@”@”@Fast and precise measurements of bias, stand-by,
”@”@”@”@”@”@powerdown currents

”@Q-STAR modules can come with various smart on-line data analysis

”@”@”Vcapable to support the user with various data analysis functions
”@”@ on the module itself and thereby accelerating the data processing.

”@Effective Cost Reduction is another key benefit from using Q-STAR

”@”@”VHigher Speed ( up to 100x on IDDQ Measurements) reduces the
”@”@”@number of required test cells.
”@”@”VTiny instruments (modules) directly fit on Probe Cards, Load or
”@”@”VAdvanced quality control results in higher yields.

”@Besides its modules Q-STAR likes to support/consult you any time

”@”@”VHigh quality Engineering work DFT and Test Strategy Improvemen.

”@”@”@”@”@”@Qstar Product

”@”@”@”@Product list

”@”@”@”@Add-on module

”@”@”@”@”@”EWide current measurement range ”V up to several A
”@”@”@”@”@”@”EWide capacitor load range ”V up to several uF
”@”@”@”@”@”@”ESimple control interface ”V 3-wire
”@”@”@”@”@”@”EEasy integration

”@”@”@”@”@”@Q-Star Test Solutions

”@”@”@”@Reduce Test Time & Costs

”@”@”@”@”@”@Reduce number of test vectors
”@”@”@”@”@”@Minimize Test Repetitions

”@”@”@”@Improve IC Quality and Reliability

”@”@”@”@Support Fast and Easy Failure Analysis

”@”@”@”@Improve Test Data Quality

”@”@”@”@”@”@Better Decision making