
”@”@”@”@IDDq design and testing solution
”@”@
”@”@
Test time (cost) reduction ”@”@”@”@”@”@”@”@”@”@
”@”@
Test data quality improvement
”@”@
Product quality and reliability improvement
”@”@”@
”@Q-Star Test”¦ static/quiescent current measurement instruments
”@(also referred to as Iddq or Issq modules) serve a wide range
”@of applications:
”@”@”@”@
Standard and advanced Iddq tests
”@”@”@”@
Stand-by current measurements
”@”@”@”@
Power-down current measurements
”@”@”@”@
Bias current measurements
”@”@”@”@
Average current measurements
”@”@”@”@
Analog DC and low frequency current measurements
”@
”@Equally, Q-Star Test”¦s dynamic current measurement instruments
”@(also referred to Iddt modules) serve a wide range of applications:
”@”@”@”@
Dynamic and transient (Iddt) current tests
”@”@”@”@
Power profiling of circuits and systems
”@”@”@”@
Active current consumption
”@”@”@”@
E-fuse programming validation
”@”@
”@”@”@”@
Improving your Device Quality by
”@”@”@”@”@”@Extended IDDQ measurements
”@”@”@”@”@”@Advanced IDDQ test strategies
”@”@”@”@”@”@Fast Low Current measurements
”@”@”@”@
Static or Dynamic Power Profiling on
”@”@”@”@”@”@Semiconductor devices
”@”@”@”@”@”@LEDs/OLEDs
”@”@”@”@”@”@Low power devices
”@”@”@”@”@”@Electronic circuits and systems
”@”@”@”@
Dynamic Current Analysis
”@”@”@”@
Fast measurements of Leakage Currents.
”@”@”@”@
Highly accurate Ӥnormalӯ Current Measurements
”@”@”@”@”@”@by tiny high resolution modules
”@”@”@”@
Fast and precise measurements of bias, stand-by,
”@”@”@”@”@”@powerdown currents
”@Q-STAR modules can come with various smart on-line data analysis
”@functions
”@”@”Vcapable to support the user with various data analysis functions
”@”@ on the module itself and thereby accelerating the data processing.
”@Effective Cost Reduction is another key benefit from using Q-STAR
”@modules:
”@”@”VHigher Speed ( up to 100x on IDDQ Measurements) reduces the
”@”@”@number of required test cells.
”@”@”VTiny instruments (modules) directly fit on Probe Cards, Load or
”@”@”@PCB-boards.
”@”@”VAdvanced quality control results in higher yields.
”@Besides its modules Q-STAR likes to support/consult you any time
”@with
”@”@”VHigh quality Engineering work DFT and Test Strategy Improvemen.
”@”@”@”@”@”@Qstar Product
”@”@”@”@
Product list

”@”@”@”@
Add-on module
”@”@”@”@”@”EWide current measurement range ”V up to several A
”@”@”@”@”@”@”EWide capacitor load range ”V up to several uF
”@”@”@”@”@”@”ESimple control interface ”V 3-wire
”@”@”@”@”@”@”EEasy integration
”@”@”@”@”@”@Q-Star Test Solutions
”@”@”@”@
Reduce Test Time & Costs
”@”@”@”@”@”@Reduce number of test vectors
”@”@”@”@”@”@Minimize Test Repetitions
”@”@”@”@
Improve IC Quality and Reliability
”@”@”@”@
Support Fast and Easy Failure Analysis
”@”@”@”@
Improve Test Data Quality
”@”@”@”@”@”@Better Decision making