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IP core library
Design-for-Manufacturing Tools for High-Performance ICs
Comprehensive prognostic solution from die level to system
InstaCell
High speed/high resolution ADC/DAC converter
Band Gap Reference (BGR)
OP amp
Design service
DFM
PDKCheck - Independent Die-Level Process Monitor
-Ridgetop’s PDKChek measures die-level process-induced
variations, both random and systematic, in MOS transistor
threshold voltage (VT), resistance, capacitance, and turn
on/off current.
YieldMaxx
- Independent Die-Level Fab Process Monitoring Tools
nanoDFM
TDDB EPU
–Time-Dependent Dielectric Breakdown Electronic Prognostics
Unit
NBTI EPU
–Negative Bias Temperature Instability Electronic Prognostic
Unit
Radiation-Hardened Design Services
Prognostic
Design for Condition-Base Maintenance
